AI-Enabled Statistical Process Control for Semiconductor Manufacturing Quality Improvement. International Journal of Scientific Research and Management (IJSRM), [S. l.], v. 13, n. 06, p. 2279–2300, 2025. DOI: 10.18535/ijsrm/v13i06.ec07. Disponível em: https://ijsrm.net/index.php/ijsrm/article/view/6439. Acesso em: 16 jun. 2025.