Few-Shot Learning for Industrial Defect Detection Using Meta-Learning Techniques. International Journal of Scientific Research and Management (IJSRM), [S. l.], v. 13, n. 06, p. 2301–2318, 2025. DOI: 10.18535/ijsrm/v13i06.ec08. Disponível em: https://ijsrm.net/index.php/ijsrm/article/view/6468. Acesso em: 26 jun. 2025.