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Best Practices for Measurement System Analysis (MSA) Implementation in Complex Manufacturing Environments

DOI:https://doi.org/10.18535/ijsrm/v12i04.ec08
Gaurav Rajendra Parashare (1)
1180-1199
Abstract : 106
PDF : 9

Data-Driven Process Optimization Using AI and Statistical Methods in High-Tech Manufacturing

DOI:https://doi.org/10.18535/ijsrm/v12i12.ec09
Gaurav Rajendra Parashare (1)
1854-1874
Abstract : 65
PDF : 21

AI-Enabled Statistical Process Control for Semiconductor Manufacturing Quality Improvement

DOI:https://doi.org/10.18535/ijsrm/v13i06.ec07
Gaurav Rajendra Parashare (1)
2279-2300
Abstract : 438
PDF : 135
1 - 3 of 3 items