Xin NIE — Author Profile – International Journal of Scientific Research and Management (IJSRM)
ISSN (Online): 2321-3418
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Xin NIE

School of Computer Science and Engineering, Wuhan Institute of Technology, Wuhan, Hubei
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Few-Shot Learning for Industrial Defect Detection Using Meta-Learning Techniques
International Journal of Scientific Research and Management (IJSRM) Vol. 13, No. 06 (2025) pp. 2301-2318 Jun 2025 10.18535/ijsrm/v13i06.ec08
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